目 录
1 范围··························································································…… (1)
2 概述··，，···、·····，······、·、、··、···，、，·、···············，······、··、····，·、·····、，········，·、····，··… (1)
3 技术要求············。·······································································…… (2)
3.1 外观·················································································，·····…… (2)
3.2 回零误差···········································································，·····…… (2)
3.3 示值误差·················································································…… (2)
3.4 示值的重复性····························。········································。·····…… (3)
3.5 示值的稳定性···········································································…… (3)
3.6 电源电压的变化对示值的影响······················································…… (3)
4 检定条件······························································，·····················…… (3)
4.1 检定设备·················································································…… (3)
4.2 检定环境·。···············································································…… (3)
5 检定项目和检定方法······。················································，·············…… (3)
5.1 外观检查···································································。·············…… (3)
5.2 工作台平直度的调整···································································一 (3)
5.3 回零误差的检定··································。·····································…… (4)
5.4 示值检定···················、···············，········、·······，········，·······，··、·····，···一 (4)
5.5 示值重复性的检定·····································································…… (4)
5.6 仪器示值稳定度的检定·······························································…… (5)
5.7 电源电压变化对示值影响的检定···················································…… (5)
6 检定结果的处理和检定周期····························································…… (5)
附录A 检定记录格式 ·····································································…… (6)
附录B 检定证书和检定结果通知书 (背面)格式 ·································…… (7)
光谱分析用测微密度计检定规程
范围
本规程适用于新制造、使用中和修理后的光谱分析用测微密度计的检定。
概述
光谱分析用测微密度计 (以下简称测微密度计)是光谱分析中提供定量测量的仪
器。摄谱法将若干个标样与待测样摄谱于同一感光板上后，用测微密度计测量其特征谱
线的密度。将标样中分析元素谱线的密度与其含量的对数做出工作曲线，以确定待测样
中相应元素的含量，完成光谱的定量分析。
密度D夕 的定义:对透射比T、的倒数取以10为底的对数，即
DS=1g(1/TO (1)
透射比T，的定义:谱片曝光部分与未曝光部分输出的光电信号强度A与Ao之比，
即
TS=A /A, (2)
测微密度计中的标尺有以下4种形式。
(a)密度Ds，其标尺从。一co按对数分度。
(b)透射比Tg，其标尺从0到1000均匀分度。
(c)换值密度Dw, Dw,的定义是透射比T。的倒数减去1后取10为底的对数，即
D,w=lg[ (1/T.)一1〕二lg[ (Ao/A)一11 (3)
