目 录
一 概述··························································································…… (1)
二 主要技术指标·................................................................................... (1)
三 检定条件·......................................................................................... (1)
四 检定项目和检定方法·.......................................................................... (2)
(一)外观及工作正常性检查 ·······························································…… (2)
(二)鉴相器平坦度的检定 ······。·········。············。···············。·····················。·… (2)
(三)低噪声放大器的检定 ··································································…… (3)
(四)HP 3582A频谱分析仪幅度测量不确定度的检定·································…… (4)
(五)装置噪声本底的检定 ··································································…… (4)
五 检定结果处理和检定周期·.................................................................... (5)
附录 检定记录表格式·............................................................................. (6)
本规程适用于新制造的、使用中和修理后的500MHz鉴相式相位噪声测量装置的检
定
一 概 述
鉴相式 (也称双源法或正交法)相位噪声测量装置由鉴相器、低通滤波器、低噪声
放大器、二阶锁相环和低频频谱分析仪组成。采用的基本原理是通过正交鉴相器将被测
源的随机相位起伏等效地转变为与之成正比的随机电压起伏，然后由频谱分析仪做谱分
析。测量是在计算机控制下自动进行，最后由绘图仪给出单边带 (SSB)相位噪声测量
结果的全景谱分布。
鉴相式相位噪声测量装置主要用于各类原子频标、高稳晶振、频率合成器以及其他
各种信号源的相位噪声分析，也用于二端口器件残余噪声的测量。
二 主 要 技 术 指 标
频率范围:500kH:一500MHza
基带分析频率 (f : l Hz一25kHzo
低噪声放大器:
增益的不确定度:0.5dB;
放大器噪声本底:蕊一175dBc/Hzo
鉴相器平坦度的不确定度:0.2dBo
频谱分析仪幅度测量的不确定度:1 dB.
测量装置噪声本底H (f):
